Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project
نویسندگان
چکیده
This paper presents the scientific achievements of EMRIC project that aimed at developing a new research activity which mixes EMC and IC reliability. This project contributes to improve the electromagnetic robustness (EMR) of integrated circuits over the full life-time of the electronic system, with a special emphasis on deep submicron technology. The results of this project give a unique overview about EMR in the scientific community and will contribute to develop EMR qualification procedures, EMR design techniques and EMR predictive methods. Corresponding author: Sonia Ben Dhia [email protected] Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project S. Ben Dhia, A. Boyer
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ورودعنوان ژورنال:
- Microelectronics Reliability
دوره 53 شماره
صفحات -
تاریخ انتشار 2013